Feature Classification for Control System Devices

摘要

Control systems are used to automate industrial processes, smart grids, and smart cities. Unfortunately, cyber attacks on control systems are on the rise. Additionally, control systems lack the plethora of tools available for commodity systems for forensic investigation. An important step towards the proper forensic investigation is to analyze device memory. To assist in identifying features  of device memory, we present a machine learning-based technique that integrates ontology information for feature classification in a control system device’s memory.