Feature Classification for Control System Devices

Authors

  • M Rayhan Ahmed Mithu Student
  • Mike Rogers
  • Denis Ulybyshev
  • Rajesh Manicavasagam
  • Rima Asmar Awad

DOI:

https://doi.org/10.32473/flairs.v34i1.128626

Abstract

Control systems are used to automate industrial processes, smart grids, and smart cities. Unfortunately, cyber attacks on control systems are on the rise. Additionally, control systems lack the plethora of tools available for commodity systems for forensic investigation. An important step towards the proper forensic investigation is to analyze device memory. To assist in identifying features  of device memory, we present a machine learning-based technique that integrates ontology information for feature classification in a control system device’s memory.

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Published

2021-04-18

How to Cite

Mithu, M. R. A., Rogers, M., Ulybyshev, D., Manicavasagam, R., & Asmar Awad, R. (2021). Feature Classification for Control System Devices. The International FLAIRS Conference Proceedings, 34. https://doi.org/10.32473/flairs.v34i1.128626

Issue

Section

Main Track Proceedings