Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools

Authors

  • Yoshinobu HIGAMI
  • Kewal K. SALUJA
  • Hiroshi TAKAHASHI
  • Shin-ya KOBAYASHI
  • Yuzo TAKAMATSU

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Published

2008-03-01

Issue

Vol. E91-D, No. 3 March 2008

Section

Papers