A Novel Per-Test Fault Diagnosis Method Based on the Extended <I>X</I>-Fault Model for Deep-Submicron LSI Circuits

Authors

  • Yuta YAMATO
  • Yusuke NAKAMURA
  • Kohei MIYASE
  • Xiaoqing WEN
  • Seiji KAJIHARA

Published

2008-03-01

Issue

Section

Papers