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  3. Vol. E91-C, No. 10 October 2008 /
  4. Invited Papers

Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT

Authors

  • Kenichi TAKATORI
  • Hideki ASADA
  • Setsuo KANEKO

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Published

2008-10-01

Issue

Vol. E91-C, No. 10 October 2008

Section

Invited Papers

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