Electrical Characterization of Nano-Floating Gated Silicon-on-Insulator Memory with In<SUB>2</SUB>O<SUB>3</SUB> Nano-Particles Embedded in Polyimide Insulator

Authors

  • Dong Uk LEE
  • Seon Pil KIM
  • Tae Hee LEE
  • Eun Kyu KIM
  • Hyun-Mo KOO
  • Won-Ju CHO
  • Young-Ho KIM

Published

2008-05-01

Issue

Section

Papers