A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip

Authors

  • Shoichiro KAWASHIMA
  • Isao FUKUSHI
  • Keizo MORITA
  • Ken-ichi NAKABAYASHI
  • Mitsuharu NAKAZAWA
  • Kazuaki YAMANE
  • Tomohisa HIRAYAMA
  • Toru ENDO

Published

2007-10-01