Influence of NH<SUB>3</SUB>-Plasma Pretreatment before Si<SUB>3</SUB>N<SUB>4</SUB> Passivation Film Deposition on Current Collapse in AlGaN/GaN-HEMTs

Authors

  • Shinichi HOSHI
  • Toshiharu MARUI
  • Masanori ITOH
  • Yoshiaki SANO
  • Shouhei SEKI

Published

2006-07-01

Issue

Section

Papers