A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential

Authors

  • Dondee NAVARRO
  • Takeshi MIZOGUCHI
  • Masami SUETAKE
  • Kazuya HISAMITSU
  • Hiroaki UENO
  • Mitiko MIURA- MATTAUSCH
  • Hans Jurgen MATTAUSCH
  • Shigetaka KUMASHIRO
  • Tetsuya YAMAGUCHI
  • Kyoji YAMASHITA
  • Noriaki NAKAYAMA

Published

2005-05-01

Issue

Section

Papers