On the High-Frequency Characteristics and Model of Bulk Effect in RF MOSFETs

Authors

  • Ming-Ta YANG
  • Yo-Jen WANG
  • Patricia Pei-Chen HO
  • Tzu-Jin YEH
  • Darryl Chih-Wei KUO
  • Chin-Wei KUO

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Published

2005-05-01

Issue

Vol. E88-C, No. 5 May 2005

Section

Papers