Thermally Robust Nickel Silicide Process for Nano-Scale CMOS Technology

Authors

  • Soon-Young OH
  • Jang-Gn YUN
  • Bin-Feng HUANG
  • Yong-Jin KIM
  • Hee-Hwan JI
  • Sang-Bum HUH
  • Han-Seob CHA
  • Ui-Sik KIM
  • Jin-Suk WANG
  • Hi-Deok LEE

Published

2005-04-01

Issue

Section

Papers