DE OLIVEIRA JR, M.; SEDREZ, G.; H. CAVALHEIRO, G. G. ML-based Plant Stress Detection from IoT-sensed Reduced Electromes. The International FLAIRS Conference Proceedings, [S. l.], v. 36, n. 1, 2023. DOI: 10.32473/flairs.36.133180. Disponível em: https://journals.flvc.org/FLAIRS/article/view/133180. Acesso em: 26 feb. 2024.